SIFT to present META work at CIE 2012
SIFT Researcher Michael Boldt will present work by SIFT collegues David Musliner, Timothy Woods, and John Maraist on Identifying Culprits When Probabilistic Verification Fails at the 2012 Computers and Information in Engineering Conference (CIE). This work was done under the probabilistic verification effort funded by the DARPA AVM/META program.
Paper abstract: Automatic design verification techniques are intended to check that a particular system design meets a set of formal requirements. When the system does not meet the requirements, some verification tools can perform culprit identification to indicate which design components contributed to the failure. With non-probabilistic verification, culprit identification is straightforward: the verifier returns a counterexample trace that shows how the system can evolve to violate the desired property, and any component involved in that trace is a potential culprit. For probabilistic verification, the problem is more complicated, because no single trace constitutes a counterexample. Given a set of execution traces that collectively refute a probabilistic property, how should we interpret those traces to find which design components are primarily responsible? This paper discusses an approach to this problem based on decision-tree learning. Our solution provides rapid, scalable, and accurate diagnosis of culprits from execution traces. It rejects distractions and accurately focuses attention on the components that primarily cause a property verification to fail.