SIFT Researcher, Jeff Rye, Awarded Three Patents

The United States Patent and Trademark Office has recently awarded SIFT researcher, Jeff Rye, his 6th, 7th and 8th patents for "Systems and methods for changing view perspective in 3-D graphical displays of buildings with stepped rotation" patent number 7,728,853; "Systems and methods for rendering building spaces," patent number 7,705,863;  and "Synthetic vision final approach terrain fading," patent number 7,719,483.